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Automatic bump inspection equipment - List of Manufacturers, Suppliers, Companies and Products

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X-ray wafer bump automatic inspection system 'Six-3000'

Automated X-ray inspection device for inspecting solder bumps on wafers.

The "Six-3000" is an X-ray automatic inspection device that automatically inspects and judges bumps on wafers. It uses X-rays to penetrate voids (bubbles) inside the wafer, and from the transmitted images, it calculates the diameter (area) of the voids and automatically inspects whether the voids exceed the reference value. A micro-focus X-ray tube is used as the X-ray source, and a high-performance X-ray digital camera is employed for the X-ray imaging section, enabling the extraction of high-resolution images and allowing for high-precision void inspection. 【Features】 ■ High-resolution images can be extracted ■ High-precision void inspection is possible ■ High-speed inspection and inspection of small wafer bumps are possible *For more details, please refer to the catalog or feel free to contact us.

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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X-ray wafer bump automatic inspection system 'Six-3000'

Transmitting X-rays to the voids inside the wafer! Automatically inspecting the quality of voids above the reference value.

The "Six-3000" is an automatic X-ray inspection device that inspects and determines bumps on wafers. It uses X-rays to penetrate voids inside the wafer and calculates the diameter (area) of the voids from the transmitted images, automatically determining the quality of voids exceeding the reference value. A micro-focus X-ray tube is used as the X-ray source, and an X-ray digital camera is employed for the X-ray detection part, allowing for the extraction of high-resolution images. This enables high-precision void inspection. Additionally, we also offer the silicon wafer crystal defect void inspection device "X-CAS-2." 【Features of Six-3000】 ■ An automatic X-ray inspection device that inspects and determines bumps on wafers ■ Uses X-rays to penetrate voids (bubbles) inside the wafer ■ Automatically determines the quality of voids exceeding the reference value ■ Uses a micro-focus X-ray tube as the X-ray source ■ Employs an X-ray digital camera for the detection part, extracting high-resolution images *For more details, please refer to the PDF materials or feel free to contact us.

  • X-ray inspection equipment

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